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(12) United States Patent

Manens et al.

(io) Patent No.: (45) Date of Patent:

US 7,112,270 B2 Sep. 26, 2006

[blocks in formation]

4,713,149 A 12/1987 Hoshino

4,793,895 A 12/1988 Kaanta et al 156/627

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(Continued)
FOREIGN PATENT DOCUMENTS
DE 3413762 Al 5/1983

(Continued)

OTHER PUBLICATIONS

D. Landolt, "Fundamental Aspects of Electropolishing", Mar. 18, 1996, pp. 1-11.

(Continued)

Primary Examiner—Roy King

Assistant Examiner—Michael P. Alexander

(74) Attorney, Agent, or Firm—Patterson and Sheridan

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INITIAL PROFILE

COMPUTER

PROCESS CONTROL UNIT

• PROFILE DETERMINATION

• REAL TIME MONITORING

• END POINT DETECTOR

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Page 2

U.S. PATENT DOCUMENTS

[table]

Reinhardt et al 428/147

Kishii et al.
Chen

Tolles et al 451/288

Spindt et al.

Perlov et al 438/692

Uzoh et al.

Birang 438/692

Meikle et al 451/56

Birang et al.

Uzohetal 451/5

Nagahara et al.

Robinson 51/306

Wakahara

Fujimori et al 451/443

Liu et al 438/692

Nakajima

Cooketal 451/41

Lustig et al.

Shendon et al 451/41

Ichinose et al.
Hsieh et al.

Uzoh 451/41

Ackley et al.

Liuetal 156/345

Datta et al 205/686

Damgaard et al 451/490

Akutsu et al.

Edelstein et al 156/345

Tobin 118/719

Zuniga et al 451/41

Weihs et al 205/93

Talieh 205/87

Carlson 451/56

Uzohetal 451/8

Cesna 451/41

Birang et al 451/41

Wang 204/297.09

Berman 451/72

Paton 438/693

Dow

Talieh et al.
Boehm et al.
Beckage
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Wang 204/224 M

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Want

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FOREIGN PATENT DOCUMENTS

EP 0 325 753 A2 8/1989

EP 0 455 455 6/1991

EP 1 103 346 A2 5/2001

EP 1103346 A2 * 5/2001

EP 1120694 A 8/2001

GB 2 214 520 A 9/1989

JP 11-42554 2/1999

JP 2001-77117 3/2001

WO 98/49723 11/1998

WO 99/41434 8/1999

WO 99/53119 10/1999

WO 00/03426 1/2000

WO 00/26443 5/2000

WO WO 04/024394 5/2000

WO 00/33356 6/2000

WO 02/064314 8/2000

WO 00/59682 10/2000

WO 01/49452 7/2001

WO 02/23616 3/2002

WO 03/001581 1/2003

WO WO 03/061905 Al 7/2003

OTHER PUBLICATIONS

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PCT International Preliminary Examination Report for PCT/US03/

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PCT International Search Report for US 02/04806 dated Apr. 1,

2003 (AMAT/5699.PC).

PCT International Search Report for US 03/06058 dated Jun. 25, 2003. (AMAT/5699.PC.02).

PCT Written Opinion for PCT/US02/04806, dated Mar. 9, 2004 (AMAT/5699.PC).

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PCT International Search Report dated Mar. 30, 2005 for PCT/ US2004/007501. (AMAT/7187.02.PC).

PCT Written Opinion dated Mar. 30, 2005 for PCT/US2004/ 007501. (AMAT/7187.02.PC).

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PCT International Search Report for PCT/US03/01760 dated May 27, 2003 (AMAT/6339.PC).

PCT International Search Report for PCT/US03/29230 dated Feb. 3,

2004 (AMAT/6874.PC).

Contolini, et al. "Electrochemical Planarization of ULSI Copper,"

Solid State Tech., vol. 40, No. 6, Jun. 1997.

U.S. Appl. No. 10/163,796 to Duboust, et al., filed Jun. 4, 2002.

Page 3

U.S. Appl. No. 10/151,538, filed May 16, 2002, Wang et al.
U.S. Appl. No. 10/141,459, filed May 7, 2002, Sun et al.
U.S. Appl. No. 10/038,066, filed Jan. 3, 2002, Chen et al.
U.S. Appl. No. 10/033,732, to Chen, et al., filed Dec. 27, 2001.
U.S. Appl. No. 10/032,275, to Duboust, et al., filed Dec. 21, 2001.
PCT International Search Report, EPO International Searching
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PCT Invitation to Pay Additional Fees for PCT/US04/006385 dated Mar. 22, 2005. (AMAT/7241PCT).

PCT International Search Report for PCT/US04/006385 dated May 17, 2005. (AMAT/7241PCT).

PCT Written Opinion for PCT/US04/006385 dated May 17, 2005. (AMAT/7241PCT).

* cited by examiner

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