A method and apparatus for maintaining a uniform temperature of semiconductor devices mounted on a burn-in board. A cover is positioned on the burn-in board to enclose all of the semiconductor devices mounted on the board. A plurality of such burn-in boards are then placed in a burn-in oven of conventional...http://www.google.se/patents/US6114868?utm_source=gb-gplus-sharePatent US6114868 - Uniform temperature environmental testing method for semiconductor devices
