A method and system for reducing test data volume in the testing of logic products such as integrated circuit chips. Test data loaded by a tester into the logic product to apply to portions of combinational logic circuitry therein in order to detect faults comprises “care” bits and “non-care”...http://www.google.se/patents/US7103816?utm_source=gb-gplus-sharePatent US7103816 - Method and system for reducing test data volume in the testing of logic products
