A shielded probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe may include a probe tip that extends through a dielectric substrate that supports on a first surface a signal path to test instrumentation and on a second...http://www.google.se/patents/US7304488?utm_source=gb-gplus-sharePatent US7304488 - Shielded probe for high-frequency testing of a device under test
