A method and apparatus for detecting open defects on non-probed node under test of an electrical device using capacitive lead frame technology is presented. In accordance with the method of the invention, a probed node neighboring the non-probed node under test is stimulated with a known source signal....http://www.google.se/patents/US7362106?utm_source=gb-gplus-sharePatent US7362106 - Methods and apparatus for non-contact testing and diagnosing of open connections on non-probed nodes
