An exemplary engagement probe having an outer surface comprising a grouping of a plurality of electrically conductive projecting apexes positioned in proximity to one another to engage a single test pad on a semiconductor substrate is described. Constructions are disclosed for testing apparatus comprising...http://www.google.se/patents/US7026835?utm_source=gb-gplus-sharePatent US7026835 - Engagement probe having a grouping of projecting apexes for engaging a conductive pad
