A probe card of a wafer test system includes one or more programmable ICs, such as FPGAs, to provide routing from individual test signal channels to one of multiple probes. The programmable ICs can be placed on a base PCB of the probe card, or on a daughtercard attached to the probe card. With programmability,...http://www.google.se/patents/US7245134?utm_source=gb-gplus-sharePatent US7245134 - Probe card assembly including a programmable device to selectively route signals from channels of a test system controller to probes
