A probe card for testing an electrical element such as a semiconductor wafer or a printed wiring board includes a substrate with circuitry thereon, an encapsulant layer overlying the substrate and a multiplicity of leads extending upwardly from the substrate through the encapsulant layer to terminals,...http://www.google.se/patents/US20040080328?utm_source=gb-gplus-sharePatent US20040080328 - Methods and structures for electronic probing arrays
