There is provided an IC testing apparatus capable of testing ICs each having a memory portion and a logic portion formed together on one chip within a time duration shorter than that in the case that the ICs are tested using two IC testing apparatus. There are provided, in an IC tester 10 having a predetermined...http://www.google.se/patents/US6446228?utm_source=gb-gplus-sharePatent US6446228 - Semiconductor integrated circuit testing apparatus and method of controlling the same
