A method and apparatus for mounting, inspecting, and adjusting probe card needles used during testing of fabricated circuits. A build wafer, comprised of build and scrub target patterns, is used to mount and re-work probe needle assemblies onto a probe card. Each build target is composed of a hard material...http://www.google.se/patents/US5932323?utm_source=gb-gplus-sharePatent US5932323 - Method and apparatus for mounting, inspecting and adjusting probe card needles
