A digital test system for functionally testing undiced ICs on wafers at relatively high test frequencies includes an improved probe card and interface assemblies. The probe card and interface assemblies each include a plurality of printed circuit boards laminated together as a single laminated structure....http://www.google.se/patents/US5162728?utm_source=gb-gplus-sharePatent US5162728 - Functional at speed test system for integrated circuits on undiced wafers
