A test probe assembly including a plurality of electrically conductive probe arms each of which is secured to a substrate and electrically coupled to one of electrically conductive lines provided on the substrate. An intermediate portion of the arm is arranged to be resiliently deformable when a probe...http://www.google.se/patents/US5214375?utm_source=gb-gplus-sharePatent US5214375 - Multi-point probe assembly for testing electronic device
