The invention described herein is a method for locating semiconductor device defects and for measuring the internal resistance of such devices by making use of the intrinsic distributed resistance nature of the devices. The method provides for forward-biasing a solar cell or other device while it is...http://www.google.se/patents/US4287473?utm_source=gb-gplus-sharePatent US4287473 - Nondestructive method for detecting defects in photodetector and solar cell devices
