WO2009011956A3 - Hybrid magnetoelectronic transistor - Google Patents
Hybrid magnetoelectronic transistor Download PDFInfo
- Publication number
- WO2009011956A3 WO2009011956A3 PCT/US2008/062212 US2008062212W WO2009011956A3 WO 2009011956 A3 WO2009011956 A3 WO 2009011956A3 US 2008062212 W US2008062212 W US 2008062212W WO 2009011956 A3 WO2009011956 A3 WO 2009011956A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- fet
- ferromag
- transistor
- gate
- magnetoelectronic
- Prior art date
Links
- 230000005669 field effect Effects 0.000 abstract 2
- 230000005294 ferromagnetic effect Effects 0.000 abstract 1
- 239000003302 ferromagnetic material Substances 0.000 abstract 1
- 230000007704 transition Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/82—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by variation of the magnetic field applied to the device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/49—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET
- H01L29/495—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET the conductor material next to the insulator being a simple metal, e.g. W, Mo
Abstract
The present invention may be embodied as a device that is realized by forming the gate of a field-effect transistor (FET) from a ferromagnetic material, forming a so-called 'Ferromag-FET.' In addition to its usual electrostatic action, the gate of this device generates FMF that provide an additional means to modulate its conductance. The device may be based on a MOSFET, an HFET, a MESFET, a JFET, or any field-effect transistor. The Ferromag-FET can operate as a traditional transistor, which will allow an easier transition to the use of this new technology within existing products. Due to the nature of the ferromagnetic gate, the Ferromag-FET may also be utilized for non-volatile storage of data.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US92708007P | 2007-05-01 | 2007-05-01 | |
US60/927,080 | 2007-05-01 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2009011956A2 WO2009011956A2 (en) | 2009-01-22 |
WO2009011956A3 true WO2009011956A3 (en) | 2009-08-13 |
Family
ID=40260285
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2008/062212 WO2009011956A2 (en) | 2007-05-01 | 2008-05-01 | Hybrid magnetoelectronic transistor |
Country Status (1)
Country | Link |
---|---|
WO (1) | WO2009011956A2 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8860006B2 (en) * | 2010-03-26 | 2014-10-14 | The Regents Of The University Of California | Spin transistor having multiferroic gate dielectric |
US9337334B2 (en) | 2014-04-21 | 2016-05-10 | Globalfoundries Inc. | Semiconductor memory device employing a ferromagnetic gate |
US9276040B1 (en) | 2014-10-27 | 2016-03-01 | Board Of Regents Of The University Of Nebraska | Majority- and minority-gate logic schemes based on magneto-electric devices |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4831427A (en) * | 1987-07-23 | 1989-05-16 | Texas Instruments Incorporated | Ferromagnetic gate memory |
JP2004235568A (en) * | 2003-01-31 | 2004-08-19 | Japan Science & Technology Agency | Field effect transistor |
US20040238887A1 (en) * | 2001-07-05 | 2004-12-02 | Fumiyuki Nihey | Field-effect transistor constituting channel by carbon nano tubes |
WO2005104240A1 (en) * | 2004-04-27 | 2005-11-03 | Agency For Science, Technology And Research | Magneto-electric field effect transistor for spintronic applications |
WO2006015822A2 (en) * | 2004-08-06 | 2006-02-16 | Austriamicrosystems Ag | High-voltage nmos-transistor and associated production method |
-
2008
- 2008-05-01 WO PCT/US2008/062212 patent/WO2009011956A2/en active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4831427A (en) * | 1987-07-23 | 1989-05-16 | Texas Instruments Incorporated | Ferromagnetic gate memory |
US20040238887A1 (en) * | 2001-07-05 | 2004-12-02 | Fumiyuki Nihey | Field-effect transistor constituting channel by carbon nano tubes |
JP2004235568A (en) * | 2003-01-31 | 2004-08-19 | Japan Science & Technology Agency | Field effect transistor |
WO2005104240A1 (en) * | 2004-04-27 | 2005-11-03 | Agency For Science, Technology And Research | Magneto-electric field effect transistor for spintronic applications |
WO2006015822A2 (en) * | 2004-08-06 | 2006-02-16 | Austriamicrosystems Ag | High-voltage nmos-transistor and associated production method |
Also Published As
Publication number | Publication date |
---|---|
WO2009011956A2 (en) | 2009-01-22 |
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