WO1996007158A3 - Method for detecting imperfections on a surface inspected - Google Patents
Method for detecting imperfections on a surface inspected Download PDFInfo
- Publication number
- WO1996007158A3 WO1996007158A3 PCT/FI1995/000469 FI9500469W WO9607158A3 WO 1996007158 A3 WO1996007158 A3 WO 1996007158A3 FI 9500469 W FI9500469 W FI 9500469W WO 9607158 A3 WO9607158 A3 WO 9607158A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- clusters
- blobs
- level
- imperfection
- classification
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0006—Industrial image inspection using a design-rule based approach
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
- G01N21/8903—Optical details; Scanning details using a multiple detector array
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20021—Dividing image into blocks, subimages or windows
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
Abstract
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI944023A FI100366B (en) | 1994-09-01 | 1994-09-01 | Procedure for identifying deviations in a surface being examined |
FI944023 | 1994-09-01 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO1996007158A2 WO1996007158A2 (en) | 1996-03-07 |
WO1996007158A3 true WO1996007158A3 (en) | 1996-03-28 |
Family
ID=8541287
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/FI1995/000469 WO1996007158A2 (en) | 1994-09-01 | 1995-09-01 | Method for detecting imperfections on a surface inspected |
Country Status (2)
Country | Link |
---|---|
FI (1) | FI100366B (en) |
WO (1) | WO1996007158A2 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FI20070085L (en) * | 2007-02-01 | 2008-08-02 | Piitek Oy | Sorting procedure |
AT511399B1 (en) * | 2011-05-13 | 2013-09-15 | Polymer Competence Ct Leoben Gmbh | METHOD FOR THE AUTOMATED CLASSIFICATION OF INCLUSIONS |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0048568A2 (en) * | 1980-09-19 | 1982-03-31 | Trw Inc. | Defect analysis system |
EP0093422A2 (en) * | 1982-05-03 | 1983-11-09 | Honeywell Inc. | Method and apparatus for detection and classification of surface imperfections |
US5274713A (en) * | 1991-09-23 | 1993-12-28 | Industrial Technology Research Institute | Real-time apparatus for detecting surface defects on objects |
GB2270227A (en) * | 1992-08-28 | 1994-03-02 | Surface Inspection Ltd | Linescan visual monitoring system |
US5329596A (en) * | 1991-09-11 | 1994-07-12 | Hitachi, Ltd. | Automatic clustering method |
-
1994
- 1994-09-01 FI FI944023A patent/FI100366B/en active
-
1995
- 1995-09-01 WO PCT/FI1995/000469 patent/WO1996007158A2/en active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0048568A2 (en) * | 1980-09-19 | 1982-03-31 | Trw Inc. | Defect analysis system |
EP0093422A2 (en) * | 1982-05-03 | 1983-11-09 | Honeywell Inc. | Method and apparatus for detection and classification of surface imperfections |
US5329596A (en) * | 1991-09-11 | 1994-07-12 | Hitachi, Ltd. | Automatic clustering method |
US5274713A (en) * | 1991-09-23 | 1993-12-28 | Industrial Technology Research Institute | Real-time apparatus for detecting surface defects on objects |
GB2270227A (en) * | 1992-08-28 | 1994-03-02 | Surface Inspection Ltd | Linescan visual monitoring system |
Also Published As
Publication number | Publication date |
---|---|
FI100366B (en) | 1997-11-14 |
FI944023A0 (en) | 1994-09-01 |
FI944023A (en) | 1996-03-02 |
WO1996007158A2 (en) | 1996-03-07 |
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