WO1996007158A3 - Method for detecting imperfections on a surface inspected - Google Patents

Method for detecting imperfections on a surface inspected Download PDF

Info

Publication number
WO1996007158A3
WO1996007158A3 PCT/FI1995/000469 FI9500469W WO9607158A3 WO 1996007158 A3 WO1996007158 A3 WO 1996007158A3 FI 9500469 W FI9500469 W FI 9500469W WO 9607158 A3 WO9607158 A3 WO 9607158A3
Authority
WO
WIPO (PCT)
Prior art keywords
clusters
blobs
level
imperfection
classification
Prior art date
Application number
PCT/FI1995/000469
Other languages
French (fr)
Other versions
WO1996007158A2 (en
Inventor
Pertti Kontio
Original Assignee
Rautaruukki Oy
Pertti Kontio
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rautaruukki Oy, Pertti Kontio filed Critical Rautaruukki Oy
Publication of WO1996007158A2 publication Critical patent/WO1996007158A2/en
Publication of WO1996007158A3 publication Critical patent/WO1996007158A3/en

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/0006Industrial image inspection using a design-rule based approach
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details
    • G01N21/8903Optical details; Scanning details using a multiple detector array
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20021Dividing image into blocks, subimages or windows
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30164Workpiece; Machine component

Abstract

The invention relates to a method for detecting imperfections on a surface inspected. The method comprises the steps of providing and segmenting image information to form blobs (BL1-BL4); feature extraction for the blobs; clustering of the blobs, in which the image blobs are grouped into several clusters (A, B), each of which contains one or more blobs (BL1-BL4). The clustering is continued by further grouping the clusters (A, B) to form one or more higher-level clusters (AB) comprising lower-level clusters (A, B); and the method also comprises classification in which clusters are compared with imperfection prototypes and one or more clusters are defined that achieve sufficient classification certainty in relation to an imperfection prototype. In the invention, the clusters formed (A, B) are subjected to feature extraction, and the classification is conducted such that in addition to lower-level clusters (A, B), a higher-level cluster (AB) comprising these lower-level clusters (A, B) is compared with the imperfection prototypes.
PCT/FI1995/000469 1994-09-01 1995-09-01 Method for detecting imperfections on a surface inspected WO1996007158A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI944023A FI100366B (en) 1994-09-01 1994-09-01 Procedure for identifying deviations in a surface being examined
FI944023 1994-09-01

Publications (2)

Publication Number Publication Date
WO1996007158A2 WO1996007158A2 (en) 1996-03-07
WO1996007158A3 true WO1996007158A3 (en) 1996-03-28

Family

ID=8541287

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/FI1995/000469 WO1996007158A2 (en) 1994-09-01 1995-09-01 Method for detecting imperfections on a surface inspected

Country Status (2)

Country Link
FI (1) FI100366B (en)
WO (1) WO1996007158A2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI20070085L (en) * 2007-02-01 2008-08-02 Piitek Oy Sorting procedure
AT511399B1 (en) * 2011-05-13 2013-09-15 Polymer Competence Ct Leoben Gmbh METHOD FOR THE AUTOMATED CLASSIFICATION OF INCLUSIONS

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0048568A2 (en) * 1980-09-19 1982-03-31 Trw Inc. Defect analysis system
EP0093422A2 (en) * 1982-05-03 1983-11-09 Honeywell Inc. Method and apparatus for detection and classification of surface imperfections
US5274713A (en) * 1991-09-23 1993-12-28 Industrial Technology Research Institute Real-time apparatus for detecting surface defects on objects
GB2270227A (en) * 1992-08-28 1994-03-02 Surface Inspection Ltd Linescan visual monitoring system
US5329596A (en) * 1991-09-11 1994-07-12 Hitachi, Ltd. Automatic clustering method

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0048568A2 (en) * 1980-09-19 1982-03-31 Trw Inc. Defect analysis system
EP0093422A2 (en) * 1982-05-03 1983-11-09 Honeywell Inc. Method and apparatus for detection and classification of surface imperfections
US5329596A (en) * 1991-09-11 1994-07-12 Hitachi, Ltd. Automatic clustering method
US5274713A (en) * 1991-09-23 1993-12-28 Industrial Technology Research Institute Real-time apparatus for detecting surface defects on objects
GB2270227A (en) * 1992-08-28 1994-03-02 Surface Inspection Ltd Linescan visual monitoring system

Also Published As

Publication number Publication date
FI100366B (en) 1997-11-14
FI944023A0 (en) 1994-09-01
FI944023A (en) 1996-03-02
WO1996007158A2 (en) 1996-03-07

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