|
| US4774760 | 9 okt 1987 | 4 okt 1988 | International Business Machines Corporation | Method of making a multipad solder preform |
| US4954878 | 29 jun 1989 | 4 sep 1990 | Digital Equipment Corp. | Method of packaging and powering integrated circuit chips and the chip assembly formed thereby |
| US5105537 | 12 okt 1990 | 21 apr 1992 | International Business Machines Corporation | Method for making a detachable electrical contact |
| US5118299 | 7 maj 1990 | 2 jun 1992 | International Business Machines Corporation | Cone electrical contact |
| US5137461 | 30 okt 1990 | 11 aug 1992 | International Business Machines Corporation | Separable electrical connection technology |
| US5163834 | 23 jul 1991 | 17 nov 1992 | International Business Machines Corporation | High density connector |
| US5185073 | 29 apr 1991 | 9 feb 1993 | International Business Machines Corporation | Method of fabricating nendritic materials |
| US5190463 | 25 nov 1991 | 2 mar 1993 | International Business Machines Corporation | High performance metal cone contact |
| US5207585 | 31 okt 1990 | 4 maj 1993 | International Business Machines Corporation | Thin interface pellicle for dense arrays of electrical interconnects |
| US5252882 | 27 jun 1991 | 12 okt 1993 | Japan Radio Co., Ltd. | Surface acoustic wave device and its manufacturing method |
| US5281883 | 4 nov 1991 | 25 jan 1994 | Fujitsu Limited | Surface acoustic wave device with improved junction bonding and package miniaturization |
| US5297967 | 13 okt 1992 | 29 mar 1994 | International Business Machines Corporation | Electrical interconnector with helical contacting portion and assembly using same |
| US5321583 | 2 dec 1992 | 14 jun 1994 | Intel Corporation | Electrically conductive interposer and array package concept for interconnecting to a circuit board |
| US5363038 | 12 aug 1992 | 8 nov 1994 | Fujitsu Limited | Method and apparatus for testing an unpopulated chip carrier using a module test card |
| US5477160 | 6 aug 1993 | 19 dec 1995 | Fujitsu Limited | Module test card |
| US5949246 | 28 jan 1997 | 7 sep 1999 | International Business Machines | Test head for applying signals in a burn-in test of an integrated circuit |
| US6027346 | 29 jun 1998 | 22 feb 2000 | Xandex, Inc. | Membrane-supported contactor for semiconductor test |
| US6094059 | 1 feb 1999 | 25 jul 2000 | International Business Machines Corporation | Apparatus and method for burn-in/testing of integrated circuit devices |
| US6094060 | 1 feb 1999 | 25 jul 2000 | International Business Machines Corporation | Test head for applying signals in a burn-in test of an integrated circuit |
| US6194669 | 5 feb 1999 | 27 feb 2001 | TRW Inc. | Solder ball grid array for connecting multiple millimeter wave assemblies |
| US6345989 | 4 jan 2000 | 12 feb 2002 | Thomas & Betts International, Inc. | Circuit board side interconnect |
| US6437584 | 10 okt 2000 | 20 aug 2002 | Cascade Microtech, Inc. | Membrane probing system with local contact scrub |
| US6578264 | 11 apr 2000 | 17 jun 2003 | Cascade Microtech, Inc. | Method for constructing a membrane probe using a depression |
| US6672907 | 2 maj 2001 | 6 jan 2004 | FCI Americas Technology, Inc. | Connector |
| US6708386 | 22 mar 2001 | 23 mar 2004 | Cascade Microtech, Inc. | Method for probing an electrical device having a layer of oxide thereon |
| US6825677 | 22 mar 2001 | 30 nov 2004 | Cascade Microtech, Inc. | Membrane probing system |
| US6838890 | 29 nov 2000 | 4 jan 2005 | Cascade Microtech, Inc. | Membrane probing system |
| US6860009 | 22 mar 2001 | 1 mar 2005 | Cascade Microtech, Inc. | Probe construction using a recess |
| US6869290 | 26 maj 2004 | 22 mar 2005 | Neoconix, Inc. | Circuitized connector for land grid array |
| US6916181 | 11 jun 2003 | 12 jul 2005 | Neoconix, Inc. | Remountable connector for land grid array packages |
| US6927585 | 20 maj 2002 | 9 aug 2005 | Cascade Microtech, Inc. | Membrane probing system with local contact scrub |
| US6930498 | 29 jul 2004 | 16 aug 2005 | Cascade Microtech, Inc. | Membrane probing system |
| US7014479 | 14 sep 2004 | 21 mar 2006 | | Electrical contact and connector and method of manufacture |
| US7025601 | 2 jul 2004 | 11 apr 2006 | Neoconix, Inc. | Interposer and method for making same |
| US7056131 | 11 apr 2003 | 6 jun 2006 | Neoconix, Inc. | Contact grid array system |
| US7070419 | 26 maj 2004 | 4 jul 2006 | Neoconix Inc. | Land grid array connector including heterogeneous contact elements |
| US7090503 | 20 jul 2004 | 15 aug 2006 | Neoconix, Inc. | Interposer with compliant pins |
| US7109731 | 17 jun 2005 | 19 sep 2006 | Cascade Microtech, Inc. | Membrane probing system with local contact scrub |
| US7113408 | 11 jun 2003 | 26 sep 2006 | Neoconix, Inc. | Contact grid array formed on a printed circuit board |
| US7148711 | 3 jun 2005 | 12 dec 2006 | Cascade Microtech, Inc. | Membrane probing system |
| US7161363 | 18 maj 2004 | 9 jan 2007 | Cascade Microtech, Inc. | Probe for testing a device under test |
| US7178236 | 16 apr 2003 | 20 feb 2007 | Cascade Microtech, Inc. | Method for constructing a membrane probe using a depression |
| US7233160 | 19 nov 2001 | 19 jun 2007 | Cascade Microtech, Inc. | Wafer probe |
| US7244125 | 8 dec 2003 | 17 jul 2007 | Neoconix, Inc. | Connector for making electrical contact at semiconductor scales |
| US7244125 | 8 dec 2003 | 17 jul 2007 | Neoconix, Inc. | Connector for making electrical contact at semiconductor scales |
| US7266889 | 14 jan 2005 | 11 sep 2007 | Cascade Microtech, Inc. | Membrane probing system |
| US7271603 | 28 mar 2006 | 18 sep 2007 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7285969 | 5 mar 2007 | 23 okt 2007 | Cascade Microtech, Inc. | Probe for combined signals |
| US7304488 | 1 dec 2006 | 4 dec 2007 | Cascade Microtech, Inc. | Shielded probe for high-frequency testing of a device under test |
| US7347698 | 16 jul 2004 | 25 mar 2008 | Neoconix, Inc. | Deep drawn electrical contacts and method for making |
| US7354276 | 17 jul 2006 | 8 apr 2008 | Neoconix, Inc. | Interposer with compliant pins |
| US7355420 | 19 aug 2002 | 8 apr 2008 | Cascade Microtech, Inc. | Membrane probing system |
| US7357644 | 12 dec 2005 | 15 apr 2008 | Neoconix, Inc. | Connector having staggered contact architecture for enhanced working range |
| US7368927 | 5 jul 2005 | 6 maj 2008 | Cascade Microtech, Inc. | Probe head having a membrane suspended probe |
| US7371073 | 3 jan 2007 | 13 maj 2008 | Neoconix, Inc. | Contact grid array system |
| US7383632 | 18 mar 2005 | 10 jun 2008 | Neoconix, Inc. | Method for fabricating a connector |
| US7400155 | 3 feb 2004 | 15 jul 2008 | Cascade Microtech, Inc. | Membrane probing system |
| US7403025 | 23 aug 2006 | 22 jul 2008 | Cascade Microtech, Inc. | Membrane probing system |
| US7403028 | 22 feb 2007 | 22 jul 2008 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
| US7417446 | 22 okt 2007 | 26 aug 2008 | Cascade Microtech, Inc. | Probe for combined signals |
| US7420381 | 8 sep 2005 | 2 sep 2008 | Cascade Microtech, Inc. | Double sided probing structures |
| US7427868 | 21 dec 2004 | 23 sep 2008 | Cascade Microtech, Inc. | Active wafer probe |
| US7436194 | 24 okt 2007 | 14 okt 2008 | Cascade Microtech, Inc. | Shielded probe with low contact resistance for testing a device under test |
| US7443186 | 9 mar 2007 | 28 okt 2008 | Cascade Microtech, Inc. | On-wafer test structures for differential signals |
| US7449899 | 24 apr 2006 | 11 nov 2008 | Cascade Microtech, Inc. | Probe for high frequency signals |
| US7453276 | 18 sep 2007 | 18 nov 2008 | Cascade Microtech, Inc. | Probe for combined signals |
| US7456646 | 18 okt 2007 | 25 nov 2008 | Cascade Microtech, Inc. | Wafer probe |
| US7482823 | 24 okt 2007 | 27 jan 2009 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7489149 | 24 okt 2007 | 10 feb 2009 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7492175 | 10 jan 2008 | 17 feb 2009 | Cascade Microtech, Inc. | Membrane probing system |
| US7495461 | 18 okt 2007 | 24 feb 2009 | Cascade Microtech, Inc. | Wafer probe |
| US7498829 | 19 okt 2007 | 3 mar 2009 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7501842 | 19 okt 2007 | 10 mar 2009 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7504842 | 11 apr 2007 | 17 mar 2009 | Cascade Microtech, Inc. | Probe holder for testing of a test device |
| US7514944 | 10 mar 2008 | 7 apr 2009 | Cascade Microtech, Inc. | Probe head having a membrane suspended probe |
| US7518387 | 27 sep 2007 | 14 apr 2009 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7533462 | 1 dec 2006 | 19 maj 2009 | Cascade Microtech, Inc. | Method of constructing a membrane probe |
| US7535247 | 18 jan 2006 | 19 maj 2009 | Cascade Microtech, Inc. | Interface for testing semiconductors |
| US7541821 | 29 aug 2007 | 2 jun 2009 | Cascade Microtech, Inc. | Membrane probing system with local contact scrub |
| US7587817 | 24 jul 2006 | 15 sep 2009 | Neoconix, Inc. | Method of making electrical connector on a flexible carrier |
| US7597561 | 18 mar 2005 | 6 okt 2009 | Neoconix, Inc. | Method and system for batch forming spring elements in three dimensions |
| US7609077 | 11 jun 2007 | 27 okt 2009 | Cascade Microtech, Inc. | Differential signal probe with integral balun |
| US7619419 | 28 apr 2006 | 17 nov 2009 | Cascade Microtech, Inc. | Wideband active-passive differential signal probe |
| US7621756 | 29 okt 2007 | 24 nov 2009 | Neoconix, Inc. | Contact and method for making same |
| US7625220 | 21 apr 2006 | 1 dec 2009 | | System for connecting a camera module, or like device, using flat flex cables |
| US7628617 | 22 sep 2006 | 8 dec 2009 | Neoconix, Inc. | Structure and process for a contact grid array formed in a circuitized substrate |
| US7645147 | 5 apr 2006 | 12 jan 2010 | Neoconix, Inc. | Electrical connector having a flexible sheet and one or more conductive connectors |
| US7656172 | 18 jan 2006 | 2 feb 2010 | Cascade Microtech, Inc. | System for testing semiconductors |
| US7681312 | 31 jul 2007 | 23 mar 2010 | Cascade Microtech, Inc. | Membrane probing system |
| US7688097 | 26 apr 2007 | 30 mar 2010 | Cascade Microtech, Inc. | Wafer probe |
| US7723999 | 22 feb 2007 | 25 maj 2010 | Cascade Microtech, Inc. | Calibration structures for differential signal probing |
| US7737709 | 28 aug 2007 | 15 jun 2010 | FormFactor, Inc. | Methods for planarizing a semiconductor contactor |
| US7750652 | 11 jun 2008 | 6 jul 2010 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
| US7758351 | 18 apr 2007 | 20 jul 2010 | Neoconix, Inc. | Method and system for batch manufacturing of spring elements |
| US7759953 | 14 aug 2008 | 20 jul 2010 | Cascade Microtech, Inc. | Active wafer probe |
| US7761983 | 18 okt 2007 | 27 jul 2010 | Cascade Microtech, Inc. | Method of assembling a wafer probe |
| US7761986 | 10 nov 2003 | 27 jul 2010 | Cascade Microtech, Inc. | Membrane probing method using improved contact |
| US7764072 | 22 feb 2007 | 27 jul 2010 | Cascade Microtech, Inc. | Differential signal probing system |
| US7876114 | 7 aug 2008 | 25 jan 2011 | Cascade Microtech, Inc. | Differential waveguide probe |
| US7888957 | 6 okt 2008 | 15 feb 2011 | Cascade Microtech, Inc. | Probing apparatus with impedance optimized interface |
| US7891988 | 6 nov 2009 | 22 feb 2011 | Neoconix, Inc. | System and method for connecting flat flex cable with an integrated circuit, such as a camera module |
| US7893704 | 20 mar 2009 | 22 feb 2011 | Cascade Microtech, Inc. | Membrane probing structure with laterally scrubbing contacts |
| US7898273 | 17 feb 2009 | 1 mar 2011 | Cascade Microtech, Inc. | Probe for testing a device under test |
| US7898281 | 12 dec 2008 | 1 mar 2011 | Cascade Mircotech, Inc. | Interface for testing semiconductors |
| US7940069 | 15 dec 2009 | 10 maj 2011 | Cascade Microtech, Inc. | System for testing semiconductors |
| US7989945 | 14 feb 2007 | 2 aug 2011 | Neoconix, Inc. | Spring connector for making electrical contact at semiconductor scales |
| US8013623 | 3 jul 2008 | 6 sep 2011 | Cascade Microtech, Inc. | Double sided probing structures |
