DE19922082A1 - Device for testing electronic functional capability of elements with various geometries uses a sliding contact device without depending on an element's geometry. - Google Patents

Abstract

An electronic element (1) to be tested is brought near to the side of a contact device (5) opposite a connecting element (3) causing an electrical contact. The contact device has an essentially tape-shaped construction. Its contact direction is flexible and vertical to the contact surface. It is electrically conductive in the contacting direction but insulates at right angles to the contacting direction.

Description

The present invention relates to a device for Testing the electrical functionality of elektroni components of different geometry, ins special of integrated circuits with which in Ober Concept of claim 1 specified features.

It is a device for testing electrical radio ability of electronic components to be known, in which the electronic component to be tested is selected insert into a contact socket during the test process is.

This test device with a contact base has on the one hand the disadvantage that for each different Ausfüh Form of an electronic component to be tested Pin separate, to the respective embodiment of the te constant electronic component more precisely adapted Contact base is to be used, its cost are each around DM 10,000.00.

The service life of such a contact socket is usually about 50,000 test cycles. With a test time of 1 second and a cycle time of 2 seconds, the service life of the contact base is only about 2 days (50,000 cycles × 2 sec / cycle = 100,000 sec ≈ 28 hours ≈ 2 days). Accordingly, a new contact socket must be purchased every two days for around DM 10,000.00, which is why the test costs there are considerable.

Due to the high rate of innovation at elektro African components, these contact bases are not before manufactured kept in stock, but must after can be customized. The Lie Contact base times are around 4 weeks.

The installation of a new contact socket in the test Device is time consuming and requires a long time arduous and tedious assembly and alignment of the contact base as well as a time-consuming check of the functionality ability and alignment of the contact base.

From the prior art is also a device for Testing electronic components known, in which egg ne fixed elastomer film with integrated cable wires as a means of contact for the transmission of signals between the electronic component to be tested and serves as the test base.

There are usually pronounced oxide layers and / or flux layers on the contacts of the te constant electronic components. During the contact tion process between the film-shaped contact means and the contacts of the electronic components happen always to a deposit of the oxide layers and / or Flux layers on the film-shaped contact element. The same applies to the contact surfaces of a contact base.

This tray, which grows with each contacting process stanchions lead in those known from the prior art Devices in particular to the serious disadvantage a constantly changing and possibly strong limited electrical conductivity.  

Only with considerable cleaning effort and with loss bringing the entire test device to a standstill it, these oxide and / or flux layers at least in remove to some extent.

Because of the soiled contact points Poor contact quality due to number rich electrically perfect components mistakenly as incorrectly sorted out. With expensive electronic components len, the reduced tweets make flawless Components particularly noticeable.

The because of the permanent build up of oxide and / or flux middle layer constantly fluctuating electrical conductivity speed of the contact means also causes a very low Measurement certainty. Costly and time-consuming re-measurements and an unnecessarily high scrap of perfect electrical Components are the result.

As soon as in particular the film-shaped, large-area contact medium by the deposited oxide and / or flux layers in the contact area is dirty set by a new large-area, foil-shaped con clock means displayed.

The Te device known from the prior art Most electronic components with a film-shaped Contact element therefore has the disadvantage that it Use of large areas of expensive, foil-like contact elements required, although a large part of each foil-shaped contact element, for example the Randbe rich or that between the component contacts Area that is still unused.  

Especially since the film-like known from the prior art Contact element after a small number of con Clocking due to the deposition of oxide and / or Flux layers and / or through wear of the Elasto mer-Materials is in need of renovation a very short lifespan and service life.

The object of the present invention is therefore the ready position of a device for testing the electrical Functionality of electronic components, which even for several different embodiments electronic components - and thus when changing of the component type - instead of a variety of expensive and contact bases to be ordered in the long term only, comparatively extremely inexpensive contact medium required, the contact medium not depending the dimensions of the electronics to be tested specific component is to be made individually with long order times, but due to its universal applicability for many Aus leadership forms of electronic components a warehouse tion makes it profitable and thus excluding a long one Ordering time is immediately available and the installati on the contact means in the test device especially simple, fast and without complex adjustment and con trolling is possible, which a cleaning of the Kon clocking means between the electronic component on the one hand and the electrically conductive with the test facility related connector on the other hand basically does not need and consequently the problem of one lossy, frequent stoppage of the entire Test device during the usually common does not know leading contact agent cleaning work, their contact quality and measurement reliability despite number rich contacts essentially unchanged and  are very high, which makes the loss-making sorting of faultless electronic components considerably reduced and the yield of flawless electronic components is significantly increased, which the Area of the expensive contact means compared to that of known test device essential fully exploited and thus a cheaper Test operation allowed and which over a very long life life and service life of your contact material.

According to the invention, this task is performed in a generic manner ß device by the in the characterizing part of Pa Features specified 1 solved.

Particularly preferred embodiments are the subject of Subclaims.

Embodiments of the invention are based on the Drawings described in more detail. Show it:

Fig. 1 is a schematic, perspective view of a device according to the invention for testing the electrical functionality of electronic components from obliquely top left with a wound on a cassette-shaped unwinding and reeling device, trans portable and band-shaped contact means;

Fig. 2 shows a schematic cross section through a contact means according to the invention with integrated therein, extending in the contacting direction, wire-shaped conductors;

Fig. 3 shows a schematic cross section through a contact means according to the invention with integrated therein, extending obliquely to the contacting direction, the wire-shaped conductors;

Fig. 4 shows a schematic cross section through a contact means used according to the invention with at least partially integrated therein, extending in the contacting direction, wire-shaped conductors;

Fig. 5 is a schematic, perspective rear view of a cassette for roll-up and / or roll-off mounting and storage of a band-shaped contact means;

Fig. 6 is a schematic, perspective frontwärtsi ge view of a cassette for roll-up and / or roll-off mounting and storage of a substantially band-shaped contact means, in which a gaseous medium is supplied or discharged via the shafts of the cassette, which at least partially the band-shaped contact means and sweeps on one or both sides and thus brings it to a preset temperature;

Fig. 7 is a schematic, perspective view of a device according to the invention for testing the electrical rule. Functionality of electronic components from diagonally top left with a transportable and band-shaped contact means wound on a unwinding and reeling device.

As can be seen in particular from Fig. 1, the device according to the invention for testing the electrical functionality of electronic components ( 1 ), in particular of integrated circuits, comprises at least one electrically conductive connecting element ( 3 ).

In general, the component to be tested ( 1 ) facing away from the rear and / or the edge region of this connec tion element ( 3 ) indirectly or directly with an electrical test device ( 4 ) for testing the electrical functionality of electronic components ( 1 ) electrically conductive connected.

The opposite side of the connecting element ( 3 ), that is to say the side facing the component to be tested ( 1 ), is preferably in direct or indirect direct electrical contact with at least one contact means ( 5 ) or can be connected thereto - for example by pressing on by means of the electronic component to be tested Component ( 1 ) - electrically connected.

To carry out the testing process, the electronic component ( 1 ) to be tested is placed on the side of the contact means ( 5 ) opposite the connecting element ( 3 ), while establishing an electrically conductive connection between the electronic component ( 1 ), the contact means ( 5 ) and the connecting element ( 3 ) introduced. As an alternative to this, it is possible to bring the connecting element ( 3 ) together with the contact means ( 5 ) with an electrically conductive connection to the possibly fixed electronic component ( 1 ).

As can be seen in particular from FIGS. 2 to 4 and 7, the contact means ( 5 ) has, for example, an essentially film, foil, strip, sheet, or band-shaped structure.

In the contact direction oriented perpendicular to the contact surface, the contact means ( 5 ) is preferably at least somewhat elastic. Of course, it is possible to make the contact means ( 5 ) non-resilient in the contacting direction oriented perpendicular to the contact surface.

If the contact means ( 5 ) is elastic, it changes back to its original state after being deformed by the contacts of the electronic component ( 1 ) to be tested during the test process.

The contact means ( 5 ) can have energy elasticity (steel elasticity) or entropy elasticity (rubber elasticity).

In preferred embodiments, the contact means ( 5 ) is electrically conductive in the contacting direction, physically or by incorporating electrically conductive materials, and is electrically insulating at right angles to the contacting direction.

An essential feature of the device according to the invention for testing the electrical functionality of electronic components ( 1 ) is that the contact means ( 5 ) is preferably at least somewhat displaceable in the direction of the z and / or x and / or y axis. Alter native or in addition to this, it is possible to move the connec tion element ( 3 ) together with the electrical component ( 1 ) in a fixed end assignment to one another with respect to the contact means ( 5 ).

The displacement of the contact means ( 5 ) can, for example, take place with indirect or direct coupling with the movement of the handling device ( 2 ), essentially excluding a reduction in the component throughput. If necessary, the displacement of the contact means ( 5 ) takes place during the handling of the electronic component ( 1 ) and before and / or after the actual test procedure.

In particular, Fig. 1 shows that the device according to the invention for testing the electrical functionality of electronic components has at least one manual or automatic handling device ( 2 ) for positioning electronic components ( 1 ) in x- and / or y- and / or z- Direction includes. In preferred embodiments, the handling device ( 2 ) itself can be moved in the x and / or y and / or z direction.

The contact means ( 5 ) can essentially be an electrically insulating, strip, sheet, strip, sheet or plate-shaped film ( 7 ) which does not yield in the contacting direction.

In particularly preferred embodiments, however, this film ( 7 ) is in the form of an elastomer film. The elastomer can, for example, be selected from the group consisting of silicones, natural rubber, synthetic polyispren, rubber, acrylate rubber, polyester-urethane rubber, halogenated butyl rubber, polybutadiene, halogenated polyethylene, epichlorohydrin (homopolymer, copolymers). Polychloroprene, sulfurized polyethylene, ethylene-acrylate rubber, sulfur-crosslinked ethylene-prepylene terpolymer, peroxidically cross-linked ethylene-propylene copolymer, polyether-urethane rubber, ethylene-vinyl acetate copolymer, fluororubber, fluorosilicone rubber, hydrogenated nitrile Rubber, butyl rubber, vinyl-containing dimethylpolysiloxane, thioplastics, polyfluorophosphazenes, polynorbornene and styrene-butadiene rubber.

Preferably, a plurality of wire-shaped conductors ( 6 ) extending in the contacting direction are at least partially integrated into the film-like or band-shaped contact means ( 5 ).

Fig. 4 shows that the ends of the wire-shaped conductors ( 6 ) protrude at least slightly from the front and / or back of the contact means ( 5 ) to ensure particularly secure contacting.

As can be seen in particular from FIGS. 2 to 4, the essentially wire-shaped conductors ( 6 ) can be oriented at a right angle or at an angle to the surface of the contact means ( 5 ). The conductors ( 6 ) consist, for example, of a gold-plated wire and are usually only very slightly apart.

The contact means ( 5 ) can be provided, for example, essentially in the form of a tape and can be unwound or rewound in an interchangeable cassette ( 8 ) or preferably on an unwinding and reeling device ( 9 ) at least partially integrated into the test device (see in particular Fig. 1, 6 and 7), the cassette ( 8 ) generally only having a supporting function for the contact means ( 5 ).

As can be seen in particular from Fig. 6, the axes of rotation of the cassette ( 8 ) or the roll-up and roll-off device ( 9 ) can be driven in rotation, for example, by at least one (step) motor and / or manually.

Since the testing process of the electronic component ( 1 ) is to be carried out at precisely predetermined temperatures, in preferred embodiments the contact means ( 5 ) and / or the cassette ( 8 ) and / or the unwinding and rolling device ( 9 ) is directly or indirectly on one preset temperature can be brought by heating and / or cooling.

As can be seen in particular from Fig. 6, for this purpose, for example, a gaseous medium brought to a preset temperature of the cassette ( 8 ) can be supplied via the axes of rotation and the gaseous medium via corresponding outlet openings on the front and / or on the back of the contact means ( 5 ) to be conducted.

To ensure a constant temperature during numerous test cycles, it is possible to at least partially integrate the cassette ( 8 ) and / or the reel-up and unwinding device ( 9 ) directly or indirectly into the optionally kastenformi thermal insulation ( 10 ) of the device according to the invention or to be provided within this.

As a rule, the connecting element ( 3 ) on its side facing the electronic component ( 1 ) to be tested has one or more electrically conductive connection elements in an arrangement which corresponds to the arrangement of the connection elements of the electronic component ( 1 ) to be tested.

On the electronic component ( 1 ) facing away from the connecting element ( 3 ) or in the edge region, one or more electrically conductive connecting elements can be provided for the indirect or direct connection of a test device ( 4 ) (see in particular Figs. 1 and 7).

As a rule, the test device ( 4 ) generates, on the one hand, input signals directed to the component to be tested ( 1 ) via the connecting element ( 3 ) and the contact means ( 5 ). On the other hand, the test device ( 4 ) of the electronic component ( 1 ) via the connecting element ( 3 ) and the contact means ( 5 ) can evaluate the response signals given and thereby provide information about the electrical functionality of the electronic component to be tested ( 1 ).

In preferred embodiments, the test device ( 4 ) with the handling device ( 2 ) and / or with the device for positioning the handling device ( 2 ) in an electrically conductive connection, so that the electronic component to be tested ( 1 ) after the test process, if necessary sorted by quality classes, can be filed specifically.

Preferably, the contact means ( 5 ) after a pre-set number of contacting operations by the electronic components ( 1 ) to be tested, are at least slightly pushed relative to the test position of the connecting element ( 3 ) and the test position of the electronic component ( 1 ).

Due to this measure, a previously unused area of the contact means ( 5 ) enters the contact area between the electronic component ( 1 ) to be tested and the connecting element ( 3 ). There is thus a largely complete utilization of the total area of the contact means ( 5 ).

In particularly preferred embodiments, the displacement of the contact means ( 5 ) relative to the test position of the connecting element ( 3 ) and the test position of the electronic component ( 1 ) takes place in a y-contact direction in the x- and / or z-direction, in a z-contact direction in the x and / or y direction and in the case of an x contact direction in the z and / or y direction.

For particularly complete utilization of the total area of the contact means ( 5 ), this is, for example, at least by the full length and / or width of the electronic component to be tested ( 1 ) and / or by fractions thereof in a y-contact direction in x and / or z - Direction, at least somewhat displaceable in the z and / or y direction with a z contact direction and in the z and / or y direction with an x contact direction.

As an alternative or in addition to this, it is possible to test the electronic component ( 1 ) together with the connecting element ( 3 ), while maintaining the end positions required for the test process, in relation to the possibly non-displaceable contact means ( 5 ) after a preset number of Contacting processes at least by the full length and / or width of the electronic component to be tested ( 1 ) and / or by a fraction thereof at least somewhat to be pushed.

This displacement preferably also takes place at a y Contact direction in the x and / or z direction, with a z Contact direction in the x and / or y direction and at one x contact direction in the z and / or y direction.

In summary, it should be noted that the present invention provides a device for testing the electrical conductivity of electronic components, which even for several different embodiments of electronic components - and thus when changing the component type - instead of a plurality of contact bases, only a single one , comparatively extremely inexpensive contact means ( 5 ) required.

Another advantage is the fact that the contact means ( 5 ) not depending on the dimensions of the electronic component to be tested ( 1 ) in each case customer-specific in connection with long ordering times is to be made individually, but because of its universal usability for many Embodiments of electronic components makes warehousing profitable and is thus immediately available with the exclusion of a long order time.

It is advantageous in the device according to the invention that the installation of the contact means ( 5 ) in the test device is particularly simple, quick and possible without agile adjustment and control work.

It is particularly advantageous in the case of the test device of the invention further that such a part, and the electrically conductive property in connection with the test device (4) connecting element (3) does not require purification of the Kon clock means (5) between the electronic component (1) on the other hand, in principle . The device according to the invention consequently does not know the problem of a loss-causing frequent standstill of the entire test device during the contact agent cleaning work which is usually to be carried out at short intervals.

A great advantage of the device according to the invention is also to be seen in the fact that the contact quality and Measurement reliability in spite of numerous contacts are constant and very high, which means that the ver lustful sorting out of electronically perfect Components significantly reduced as defective and the Yield of perfect electronic components Lich is increased.  

The device according to the invention for testing the electrical functionality of electronic components is also advantageous because it uses the area of the expensive contact means ( 5 ) more completely in comparison to the test device known from the prior art and thus allows a more cost-effective test operation.

A major advantage of the device according to the invention is finally to be seen in the fact that it has a contact medium ( 5 ) with a very long life and service life, which has a very positive effect on its economy and profitability.

Claims (12)

1. Device for testing the electrical functionality of electronic components ( 1 ), in particular of integrated circuits, with at least one elec trically conductive connecting element ( 3 ), one of which is indirectly or directly with an electrical test device ( 4 ) for testing the electrical functi ability of electronic components ( 1 ) is electrically conductively connected and, on the other hand, is directly or indirectly electrically conductively connected with at least one contact means ( 5 ) or can be brought into an electrically conductive connection, the electronic component ( 1 ) to be tested being connected to the Connecting element ( 3 ) opposite side of the contact means ( 5 ) can be brought about by bringing about an electrically conductive contact, characterized in that the contact means ( 5 ) has a substantially film, foil, strip, sheet or sheet-like structure, in the right to the Contact surface aligned contacting direction is at least somewhat elastic or inelastic, is electrically conductive in the contacting direction and is electrically insulating at right angles to the contact direction, the contact means ( 5 ) on the one hand, or the connecting element ( 3 ) together with the electronic component ( 1 ) in a fixed end assignment to one another on the other hand, are at least somewhat displaceable in the direction of the z and / or x and / or y axis. 2. Apparatus according to claim 1, characterized in that it comprises at least one manual or automatic handling device ( 2 ) for positioning electronic components ( 1 ) in the x- and / or y- and / or z-direction. 3. Device according to one of the preceding claims, characterized in that the contact means ( 5 ) we sentlichen an electrically insulating, strip, sheet, tape, sheet or plate-shaped, in the contacting direction non-yielding film or an elastomer film ( 7 ) with essentially wire-shaped conductors ( 6 ) extending in the contacting direction and at least partially integrated into the film ( 7 ). 4. Device according to one of the preceding claims, characterized in that the contact means ( 5 ) is essentially band-shaped and wound and unwindable be or rewindable in an exchangeable cassette ( 8 ) or on an integrated in the test device from winding and reeling device ( 9 ) is provided. 5. Device according to one of the preceding claims, characterized in that the contact means ( 5 ) and / or the cassette ( 8 ) and / or the unwinding and Aufrollvorrich device ( 9 ) directly or indirectly to a preset temperature by heating and / or cooling can be brought. 6. Device according to one of the preceding claims, characterized in that the connecting element ( 3 ) on the electronic component to be tested ( 1 ) facing one or more electrically conductive connection elements in an arrangement which the connection element arrangement of the test electronic Bauele member (1), wherein on the electronic component (1) side facing away from the connecting element (3) and / or in the edge region or more elec trically conductive connecting elements for indirect or un indirect connection of a test apparatus (4) are provided. 7. Device according to one of the preceding claims, characterized in that the test device ( 4 ) to the component to be tested ( 1 ) via the connecting element ( 3 ) and the contact means ( 5 ) directed input signals he testifies and from the electronic component ( 1 ) via the connecting element ( 3 ) and the contact means ( 5 ) ne response signals output. 8. Device according to one of the preceding claims, characterized in that the contact means ( 5 ) after egg ner preset number of contacting operations by the electronic components to be tested ( 1 ) in a y-contact direction in the x and / or z direction, at az contacting direction in the x and / or y direction and in the case of an x contacting direction in the z and / or y direction, at least somewhat displaceable relative to the test position of the connecting element ( 3 ) and the test position of the electronic component ( 1 ) is so that a previously unused loading area of the contact means ( 5 ) enters the contact area between the electronic component to be tested ( 1 ) and the connecting element ( 3 ). 9. Device according to one of the preceding claims, characterized in that for largely complete use of the total area of the contact means ( 5 ) this at least by the full length and / or width of the electronic component ( 1 ) to be tested and / or parts thereof in the case of a y contact direction in the x and / or z direction, in the case of a z contact direction in the x and / or y direction and in the case of an x contact direction in the z and / or y direction. 10. Device according to one of the preceding claims, characterized in that for largely complete use of the total area of the contact means ( 5 ) the electronic component to be tested ( 1 ) together with the connecting element ( 3 ), in each case while maintaining the suitable for the test process End positions, in relation to the non-displaceable contact means ( 5 ) after a preset number of contacting operations by at least the full length and / or width of the electronic component ( 1 ) to be tested and / or by fractions thereof in a y-contact direction in x- and / or z direction, with a z contact direction in the x and / or y direction and with an x contact direction in the z and / or y direction are at least somewhat displaceable. 11. Device according to one of the preceding claims, characterized in that the displacement of the contact by means of ( 5 ) takes place in direct or indirect coupling with the movement of the handling device ( 2 ) in essence, excluding a reduction in the throughput of components. 12. Device according to one of the preceding claims, characterized in that the displacement of the contact by means of ( 5 ) by indirect or direct coupling with the movement of the handling device ( 2 ) during the handling of the electronic component ( 1 ) and before and / or after actual test process is carried out.