DE102005056323A1 - Device for simultaneously depositing layers on a number of substrates comprises process chambers arranged in a modular manner in a reactor housing - Google Patents
Device for simultaneously depositing layers on a number of substrates comprises process chambers arranged in a modular manner in a reactor housing Download PDFInfo
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- DE102005056323A1 DE102005056323A1 DE200510056323 DE102005056323A DE102005056323A1 DE 102005056323 A1 DE102005056323 A1 DE 102005056323A1 DE 200510056323 DE200510056323 DE 200510056323 DE 102005056323 A DE102005056323 A DE 102005056323A DE 102005056323 A1 DE102005056323 A1 DE 102005056323A1
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- gas
- substrate holder
- gas outlet
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- process chambers
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/54—Apparatus specially adapted for continuous coating
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45565—Shower nozzles
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4586—Elements in the interior of the support, e.g. electrodes, heating or cooling devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/6719—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the processing chambers, e.g. modular processing chambers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68742—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68764—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating caroussel
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68771—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by supporting more than one semiconductor substrate
Abstract
Description
Die Erfindung betrifft eine Vorrichtung zum gleichzeitigen Abscheiden jeweils mindestens einer Schicht auf einer Vielzahl von Substraten, wobei die schichtbildenden Komponenten in Form von Prozessgasen zusammen mit einem Trägergas mittelst eines von einer Zuleitung gespeisten Gaseinlassorgans in eine Prozesskammer eines Reaktorgehäuses eingebracht werden, aus der zumindest das Trägergas durch einen Gasauslass entfernt wird, wobei die Substrate auf mindestens einem Substrathalter aufliegen, dadurch gekennzeichnet, dass im Reaktorgehäuse eine Vielzahl von Prozesskammern modulartig angeordnet sind, die jeweils ein Gaseinlassorgan aufweisen, mit dem die jeweilige Prozesskammer mit dem Prozessgas und dem Trägergas versorgt werden und aus welchen Prozesskammern zumindest das Trägergas durch einen jeweiligen Gasauslasskanal entfernt wird.The The invention relates to a device for simultaneous deposition each at least one layer on a plurality of substrates, wherein the layer-forming components in the form of process gases together with a carrier gas by means of a gas inlet element fed by a supply line a process chamber of a reactor housing are introduced, from the at least the carrier gas is removed by a gas outlet, wherein the substrates are at least rest on a substrate holder, characterized in that in reactor housing a plurality of process chambers are arranged in a modular manner, the each having a gas inlet member, with which the respective process chamber with the process gas and the carrier gas be supplied and from which process chambers at least the carrier gas a respective gas outlet channel is removed.
Aus der US 2003/019094 A1 ist eine Vorrichtung zum Abscheiden von Schichten auf einem Substrat bekannt. Auch diese Vorrichtung ist Teil einer komplexen Beschichtungsanlage. Die Vorrichtung besitzt ein Gehäuse, welches eine Prozesskammer ausbildet. Der Boden der Prozesskammer wird von einem Substrathalter ausgebildet, auf welchem das zu beschichtende Substrat aufliegt. Oberhalb des Substrathalters befindet sich ein Gaseinlassorgan, mit welchem die Prozessgase und die Prozessgase tragende Trägergase in die Prozesskammer eingeleitet werden können, wo die chemischen Prozesse, insbesondere Oberflächenprozesse stattfinden, bei denen schichtbildende Komponenten der Gase auf der Substratoberfläche aufwachsen. Die Prozesskammer kann durch eine seitliche Öffnung beladen werden.Out US 2003/019094 A1 is an apparatus for depositing layers known on a substrate. This device is also part of a complex Coating plant. The device has a housing which a process chamber is formed. The bottom of the process chamber is from a Substrate holder formed, on which the substrate to be coated rests. Above the substrate holder is a gas inlet member, with which carrier gases carrying the process gases and the process gases into the process chamber where the chemical processes, in particular surface processes take place, in which layer-forming components of the gases on the substrate surface grow up. The process chamber can be loaded through a side opening.
Aus
der
Der Erfindung liegt die Aufgabe zugrunde, eine herstellungstechnisch und betriebstechnisch einfache Vorrichtung zum gleichzeitigen Abscheiden jeweils einer Schicht auf mehreren Substraten anzugeben.Of the Invention is based on the object, a manufacturing technology and operationally simple device for simultaneously depositing each specify a layer on several substrates.
Gelöst wird die Aufgabe durch die in den Ansprüchen angegebene Erfindung, wobei jeder Anspruch eine eigenständige Lösung der Aufgabe darstellt und jeder Anspruch mit jedem anderen Anspruch kombinierbar ist.Is solved the object by the invention specified in the claims, Each claim is an independent solution to the problem and every claim can be combined with any other claim.
Es ist zunächst und im Wesentlichen vorgesehen, dass in einem einzigen Reaktorgehäuse eine Vielzahl von Prozesskammermodulen angeordnet sind. Die Substrate, die vorzugsweise eine Kreisscheibengestalt besitzen, liegen jetzt nicht in einer gemeinsamen Prozesskammer ein, sondern jeweils in einer gesonderten Prozesskammer, die aber zumindest im Bereich des Gasauslasses miteinander strömungsverbunden sind. Die einzelnen Prozesskammermodule des Reaktorgehäuses können in einem gemeinsamen Be-/Entladeschritt mit den zu beschichtenden Substraten beladen werden. Hierzu werden die Substrathalter von einer Prozessstellung in eine Be-/Entladestellung abgesenkt. In der Prozessstellung bilden die Wände des Substrathalters einen Gasauslasskanal. Die einzelnen Prozesskammern sind in der Prozessstellung mittelst Diffusionsbarrieren derartig voneinander getrennt, dass ein Übersprechen der Gase von einer Prozesskammer in eine andere Prozesskammer vermieden ist. Die einzelnen Prozesskammern sind in einer ge meinsamen Ebene angeordnet. Bevorzugt sind die Prozesskammern um ein Zentrum gruppiert. Das Zentrum wird von einer Drehachse eines mehrere Arme umfassenden Ent-/Beladeorganes, eines sogenannten Indexers gebildet. In der Prozessstellung liegen die Arme dieses Indexers in einem Spaltzwischenraum zwischen den einzelnen Prozesskammern. Dieser Spaltzwischenraum ist von einer Außenwandung eines Gasauslasskanales verschlossen. In der Prozessstellung, in welcher der Substrathalter angehoben ist, befindet sich die Oberfläche des Substrathalters, auf welchem das Substrat aufliegt, in einer Vertikalposition, die oberhalb des Spaltraumes ist. Ein oberer Abschnitt einer Kanalaußenwandung, die fest mit dem Substrathalter verbunden ist, greift in der Prozessstellung in eine Eintrittsnut eines ringförmigen Dichtungsorganes ein, das von einer Schürze überfangen ist. Diese ringförmige Schürze bildet die Umfangswandung der Prozesskammer und erstreckt sich vom Gaseinlassorgan in vertikaler Richtung bis in den Gasauslasskanal, der von einer Kanalinnenwandung und einer Kanalaußenwandung gebildet ist, wobei die Kanalinnenwandung fest mit dem Substrathalter verbunden ist und dessen Außenwandung bildet. Wird der Substrathalter von der so eben beschriebenen Prozessstellung, in welcher das Schichtwachstum auf der Oberfläche des Substrates erfolgt, in eine Be-/Entladestellung gesenkt, so wird der Spaltzwischenraum zwischen den einzelnen Prozesskammern geöffnet. Der Substrathalter liegt in dieser Be-/und Entladestellung unterhalb des Spaltzwischenraumes. Der Substrathalter besitzt Öffnungen zum Durchtritt von Stützstiften. Die Stützstifte werden von einem unterhalb des Substrathalters angeordneten Huborgans angehoben und untergreifen das Substrat, um es vom Substrathalter zu beabstanden. Die Substrate werden dabei vertikal bis in eine Höhe verlagert, die oberhalb des Indexerarmes liegt, so dass der Indexer um seine Drehachse verschwenkt werden kann, um in eine Position unterhalb des Substrates gebracht werden zu können. Werden die Stützstifte dann zurückgezogen, so wird das Substrat auf den Indexerarm aufgelegt, so dass es durch eine entsprechende Drehung des Indexers in eine Entnahmeposition geschwenkt werden kann. Hierzu besitzt das Reaktorgehäuse eine Seitenwandöffnung, durch die ein Roboterarm in das Reaktorgehäuse eingreifen kann. Die Substrathalter werden von einer Hubdrehachse getragen, die die Substrathalter in der zuvor geschilderten Weise vertikal verlagern können. Die Achse kann den Substrathalter auch Drehantreiben. Dabei werden die Kanalinnenwand und die Kanalaußenwand mitgedreht. Die Dichtung, innerhalb der ein oberer Abschnitt der Kanalaußenwandung einliegt, ist in entsprechender Weise gestaltet. Es kann sich hierbei auch um eine Gasdichtung handeln, die in entsprechender Weise mit einem Inertgas gespült wird.It is initially and essentially provided that a plurality of process chamber modules are arranged in a single reactor housing. The substrates, which preferably have a circular disk shape, are now not in a common process chamber, but each in a separate process chamber, but at least in the region of the gas outlet flow connected to each other. The individual process chamber modules of the reactor housing can be loaded in a common loading / unloading step with the substrates to be coated. For this purpose, the substrate holders are lowered from a process position to a loading / unloading position. In the process position, the walls of the substrate holder form a gas outlet channel. The individual process chambers are separated from one another in the process position by means of diffusion barriers in such a way that crosstalk of the gases from one process chamber into another process chamber is avoided. The individual process chambers are arranged in a common plane. Preferably, the process chambers are grouped around a center. The center is formed by a rotation axis of a multi-arms Ent- / Beladeorganes, a so-called Indexers. In the process position, the arms of this indexer lie in a gap gap between the individual process chambers. This gap gap is closed by an outer wall of a Gasauslasskanales. In the process position in which the substrate holder is raised, the surface of the substrate holder, on which the substrate rests, is in a vertical position, which is above the gap space. An upper portion of a channel outer wall, which is fixedly connected to the substrate holder engages in the process position in an inlet groove of an annular sealing member, which is covered by a skirt. This annular skirt forms the peripheral wall of the process chamber and extends from the gas inlet member in the vertical direction to the gas outlet channel, which is formed by a channel inner wall and a Kanalaußenwandung, wherein the channel inner wall is fixedly connected to the substrate holder and the outer wall forms. If the substrate holder is lowered from the process position just described, in which the layer growth takes place on the surface of the substrate, into a loading / unloading position, the gap gap between the individual process chambers is opened. The substrate holder lies in this loading and unloading below the gap gap. The substrate holder has openings for the passage of support pins. The support pins are lifted by a lifting member located below the substrate holder and engage under the substrate to space it from the substrate holder. The substrates are thereby displaced vertically to a height which is above the indexer arm, so that the indexer can be pivoted about its axis of rotation in order to be able to be brought into a position below the substrate can. If the support pins are then withdrawn, the substrate is placed on the indexer arm, so that it can be pivoted by a corresponding rotation of the indexer in a removal position. For this purpose, the reactor housing has a side wall opening through which a robot arm can engage in the reactor housing. The substrate holders are carried by a Hubdrehachse, which can move the substrate holder in the manner previously described vertically. The axle can also drive the substrate holder. In this case, the channel inner wall and the channel outer wall are rotated. The seal, within which an upper portion of the channel outer wall rests, is designed in a corresponding manner. It may also be a gas seal, which is flushed in a corresponding manner with an inert gas.
Die Gaszuleitungen, die in das Gaseinlassorgan mündet, können mit einem gemeinsamen Gasmischsystem verbunden sein, in welchem das Prozessgas mit dem Trägergas gemischt wird. Die ringförmigen Gasauslasskanäle jeder Prozesskammer sind mit einem gemeinsam Gassammelkanal verbunden, an welchem bspw. eine Vakuumpumpe angeschlossen ist.The Gas supply lines, which opens into the gas inlet element, with a common Gas mixing system be connected, in which the process gas with the carrier gas is mixed. The annular ones gas discharge ports each process chamber are connected to a common gas collection channel, to which, for example, a vacuum pump is connected.
Während in der Beladestellung alle Prozesskammern miteinander kommunizieren, sind sie in der Prozessstellung mittelst Diffusionsbarrieren voneinander getrennt. Es handelt sich bevorzugt um dynamische Diffusionsbarrieren, die durch Trennflüsse ausgebildet sind.While in the loading position all process chambers communicate with each other, are they in the process position by means of diffusion barriers from each other separated. They are preferably dynamic diffusion barriers, formed by separating flows are.
Ein Ausführungsbeispiel der Erfindung wird nachfolgend anhand beigefügter Zeichnungen erläutert. Es zeigen:One embodiment The invention will be explained below with reference to the accompanying drawings. It demonstrate:
Das
mit der Bezugsziffer
Die
Jede
der vier Prozesskammern besitzt einen kreisscheibenförmigen Substrathalter
Die
Decke einer jeder Prozesskammer
Die
Kanalinnenwandung
Ein
oberer Abschnitt
Wird
der Substrathalter
Die
Werden
ausgehend von der in der
Es
wird als wesentlich erachtet, dass durch ein vertikales Verlagern
der Suszeptoren bzw. der mit den Suszeptoren fest verbundenen Kanalwandung
Es
ist möglich,
den Substrathalter
Zufolge der Aufteilung der Prozesskammer in eine Vielzahl von Prozesskammermodulen, die in einer Prozessstellung mittels Diffusionsbarrieren pneumatisch von einander entkoppelt und die in einer End- und Beladestellung ein gemeinsames Gasvolumen ausbilden, ist einerseits eine einfache Handhabung des Prozesses möglich. Andererseits bilden sich keine (allenfalls nur geringe) Todvolumina aus, was zur Folge hat, dass in den Prozessen ein schneller Gaswechsel stattfinden kann. Dies erhöht die Effizienz des Prozesses.According to the division of the process chamber into a plurality of process chamber modules which are pneumatically decoupled from one another in a process position by means of diffusion barriers and which form a common gas volume in a final and loading position, simple handling of the process is possible on the one hand. On the other hand, no (at most only small) dead volumes are formed, which has the consequence that in the processes a fast Gas exchange can take place. This increases the efficiency of the process.
Die
Substrathalter
Alle offenbarten Merkmale sind (für sich) erfindungswesentlich. In die Offenbarung der Anmeldung wird hiermit auch der Offenbarungsinhalt der zugehörigen/beigefügten Prioritätsunterlagen (Abschrift der Voranmeldung) vollinhaltlich mit einbezogen, auch zu dem Zweck, Merkmale dieser Unterlagen in Ansprüche vorliegender Anmeldung mit aufzunehmen.All disclosed features are (for itself) essential to the invention. In the disclosure of the application will hereby also the disclosure content of the associated / attached priority documents (Copy of the advance notice) fully included, too for the purpose, features of these documents in claims present Registration with.
Claims (12)
Priority Applications (1)
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DE200510056323 DE102005056323A1 (en) | 2005-11-25 | 2005-11-25 | Device for simultaneously depositing layers on a number of substrates comprises process chambers arranged in a modular manner in a reactor housing |
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DE200510056323 DE102005056323A1 (en) | 2005-11-25 | 2005-11-25 | Device for simultaneously depositing layers on a number of substrates comprises process chambers arranged in a modular manner in a reactor housing |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102010016471A1 (en) | 2010-04-16 | 2011-10-20 | Aixtron Ag | Apparatus and method for simultaneously depositing multiple semiconductor layers in multiple process chambers |
DE102010016477A1 (en) * | 2010-04-16 | 2011-10-20 | Aixtron Ag | A thermal treatment method comprising a heating step, a treatment step and a cooling step |
US20120024479A1 (en) * | 2010-07-30 | 2012-02-02 | Applied Materials, Inc. | Apparatus for controlling the flow of a gas in a process chamber |
DE102016101003A1 (en) | 2016-01-21 | 2017-07-27 | Aixtron Se | CVD apparatus with a process chamber housing which can be removed from the reactor housing as an assembly |
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
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DE102010016471A1 (en) | 2010-04-16 | 2011-10-20 | Aixtron Ag | Apparatus and method for simultaneously depositing multiple semiconductor layers in multiple process chambers |
WO2011128226A1 (en) | 2010-04-16 | 2011-10-20 | Aixtron Se | Device and method for simultaneously precipitating a plurality of semiconductor layers in a plurality of process chambers |
DE102010016477A1 (en) * | 2010-04-16 | 2011-10-20 | Aixtron Ag | A thermal treatment method comprising a heating step, a treatment step and a cooling step |
US20120024479A1 (en) * | 2010-07-30 | 2012-02-02 | Applied Materials, Inc. | Apparatus for controlling the flow of a gas in a process chamber |
US9443753B2 (en) * | 2010-07-30 | 2016-09-13 | Applied Materials, Inc. | Apparatus for controlling the flow of a gas in a process chamber |
DE102016101003A1 (en) | 2016-01-21 | 2017-07-27 | Aixtron Se | CVD apparatus with a process chamber housing which can be removed from the reactor housing as an assembly |
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