CN101528973B - 用于原子层沉积的涡流室盖 - Google Patents

用于原子层沉积的涡流室盖 Download PDF

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Publication number
CN101528973B
CN101528973B CN200780039651XA CN200780039651A CN101528973B CN 101528973 B CN101528973 B CN 101528973B CN 200780039651X A CN200780039651X A CN 200780039651XA CN 200780039651 A CN200780039651 A CN 200780039651A CN 101528973 B CN101528973 B CN 101528973B
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gas
chamber
substrate
road
flow
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Chinese (zh)
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CN101528973A (zh
Inventor
吴典晔
庞尼特·巴贾
袁晓雄
史蒂文·H·金
舒伯特·S·楚
保罗·F·马
约瑟夫·F·奥布赫恩
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Applied Materials Inc
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Applied Materials Inc
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45502Flow conditions in reaction chamber
    • C23C16/45506Turbulent flow
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45523Pulsed gas flow or change of composition over time
    • C23C16/45525Atomic layer deposition [ALD]
    • C23C16/45527Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45582Expansion of gas before it reaches the substrate
CN200780039651XA 2006-10-24 2007-10-24 用于原子层沉积的涡流室盖 Active CN101528973B (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201410196103.XA CN104073778B (zh) 2006-10-24 2007-10-24 用于原子层沉积的涡流室盖

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US86276406P 2006-10-24 2006-10-24
US60/862,764 2006-10-24
PCT/US2007/082369 WO2008052047A2 (en) 2006-10-24 2007-10-24 Vortex chamber lids for atomic layer deposition

Related Child Applications (3)

Application Number Title Priority Date Filing Date
CN201410196103.XA Division CN104073778B (zh) 2006-10-24 2007-10-24 用于原子层沉积的涡流室盖
CN201210033178.7A Division CN102586761B (zh) 2006-10-24 2007-10-24 用于原子层沉积的涡流室盖
CN201210033172.XA Division CN102586760B (zh) 2006-10-24 2007-10-24 用于原子层沉积的涡流室盖

Publications (2)

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CN101528973A CN101528973A (zh) 2009-09-09
CN101528973B true CN101528973B (zh) 2012-04-25

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Application Number Title Priority Date Filing Date
CN201410196103.XA Active CN104073778B (zh) 2006-10-24 2007-10-24 用于原子层沉积的涡流室盖
CN201210033172.XA Active CN102586760B (zh) 2006-10-24 2007-10-24 用于原子层沉积的涡流室盖
CN201210033178.7A Active CN102586761B (zh) 2006-10-24 2007-10-24 用于原子层沉积的涡流室盖
CN200780039651XA Active CN101528973B (zh) 2006-10-24 2007-10-24 用于原子层沉积的涡流室盖

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CN201410196103.XA Active CN104073778B (zh) 2006-10-24 2007-10-24 用于原子层沉积的涡流室盖
CN201210033172.XA Active CN102586760B (zh) 2006-10-24 2007-10-24 用于原子层沉积的涡流室盖
CN201210033178.7A Active CN102586761B (zh) 2006-10-24 2007-10-24 用于原子层沉积的涡流室盖

Country Status (4)

Country Link
KR (3) KR101448447B1 (sv)
CN (4) CN104073778B (sv)
TW (2) TWI476297B (sv)
WO (1) WO2008052047A2 (sv)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102762767B (zh) 2010-03-12 2015-11-25 应用材料公司 具有多重注射道的原子层沉积腔室
US9322097B2 (en) 2013-03-13 2016-04-26 Applied Materials, Inc. EPI base ring
KR101701257B1 (ko) 2013-03-14 2017-02-01 어플라이드 머티어리얼스, 인코포레이티드 박막 캡슐화 ― oled 어플리케이션을 위한 얇은 초고 배리어 층
US9890456B2 (en) * 2014-08-21 2018-02-13 Asm Ip Holding B.V. Method and system for in situ formation of gas-phase compounds
US9951421B2 (en) * 2014-12-10 2018-04-24 Lam Research Corporation Inlet for effective mixing and purging
JP6487747B2 (ja) 2015-03-26 2019-03-20 株式会社Screenホールディングス 基板処理装置と処理ガス供給ノズル
FI128855B (sv) * 2019-09-24 2021-01-29 Picosun Oy Fluiddistributionsanordning för en tunnfilmsdeponeringsutrustning, tillhörande utrustning och förfaranden

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1774525A (zh) * 2001-10-26 2006-05-17 应用材料有限公司 用于原子层淀积的气体输送装置

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AUPO129096A0 (en) * 1996-07-26 1996-08-22 Boc Gases Australia Limited Oxygen dissolver for pipelines or pipe outlets
US5951771A (en) * 1996-09-30 1999-09-14 Celestech, Inc. Plasma jet system
US6213049B1 (en) * 1997-06-26 2001-04-10 General Electric Company Nozzle-injector for arc plasma deposition apparatus
NO309625B1 (no) * 1997-10-10 2001-02-26 V Telemark Bedriftsraa Waskaas Fremgangsmåte for reduksjon av strömningsmotstand i rör- og kanalströmning
US6495233B1 (en) * 1999-07-09 2002-12-17 Applied Materials, Inc. Apparatus for distributing gases in a chemical vapor deposition system
KR100319494B1 (ko) * 1999-07-15 2002-01-09 김용일 원자층 에피택시 공정을 위한 반도체 박막 증착장치
US6477980B1 (en) * 2000-01-20 2002-11-12 Applied Materials, Inc. Flexibly suspended gas distribution manifold for plasma chamber
US6818250B2 (en) * 2000-06-29 2004-11-16 The Regents Of The University Of Colorado Method for forming SIO2 by chemical vapor deposition at room temperature
US6734020B2 (en) * 2001-03-07 2004-05-11 Applied Materials, Inc. Valve control system for atomic layer deposition chamber
US6632325B2 (en) * 2002-02-07 2003-10-14 Applied Materials, Inc. Article for use in a semiconductor processing chamber and method of fabricating same
US20060021574A1 (en) * 2004-08-02 2006-02-02 Veeco Instruments Inc. Multi-gas distribution injector for chemical vapor deposition reactors
US7722719B2 (en) * 2005-03-07 2010-05-25 Applied Materials, Inc. Gas baffle and distributor for semiconductor processing chamber

Patent Citations (1)

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Also Published As

Publication number Publication date
TWI476297B (zh) 2015-03-11
KR20090083404A (ko) 2009-08-03
TWI410518B (zh) 2013-10-01
WO2008052047A3 (en) 2008-12-11
KR101448447B1 (ko) 2014-10-13
KR20140009593A (ko) 2014-01-22
CN104073778A (zh) 2014-10-01
TW201241228A (en) 2012-10-16
CN102586761A (zh) 2012-07-18
KR20120048685A (ko) 2012-05-15
KR101432257B1 (ko) 2014-08-21
TW200833867A (en) 2008-08-16
CN104073778B (zh) 2017-08-25
CN102586761B (zh) 2014-10-15
CN102586760A (zh) 2012-07-18
WO2008052047A2 (en) 2008-05-02
CN101528973A (zh) 2009-09-09
CN102586760B (zh) 2016-07-06

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